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Infrared Gas Sensor

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SPC-150N Series

TCSPC/FLIM Modules

SPC-150N, SPC-150NX, SPC-150NXX
PCI
FLIM, PLIM
Timing Precision (jitter, RMS) 2.5 ps/1.6 ps/1.1 ps

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Catalog

Specification

	SPC-150N	SPC-150NX		SPC-150NXX
Photon Channel
Principle	Constant Fraction Discriminator (CFD)
Discriminator Input Bandwidth	4 GHz
Time Resolution (FWHM/RMS, electr.)	6.6 ps / 2.5 ps	< 3.5 ps / 1.6 ps		< 3 ps / 1.1 ps
Variance in Time of IRF max. (RMS)	< 1 ps over 50 s	< 0.4 ps over 100 s		< 0.4 ps over 100 s
Optimum Input Voltage Range	-30 mV to -500 mV
Min. Input Pulse Width	200 ps
Threshold	0 to -250 mV
Zero Cross Adjust	-100 mV to 100 mV
Syncronisation Channel
Principle	Constant Fraction Discriminator (CFD)
Discriminator Input Bandwidth	4 GHz
Optimum Input Voltage Range	-30 mV to -500 mV
Min. Input Pulse Width	200 ps
Threshold	0 to -250 mV
Frequency Range	0 to 150 MHz
Frequency Divider	1, 2, 4
Zero Cross Adjust	-100 mV to 100 mV
Time-to-Amplitude Converters / ADCs
Principle	Ramp Generator / Biased Amplifier
TAC Range	50 ns to 5 µs	25 ns to 2.5 µs		12.5 ns to 50 ns
Biased Amplifier Gain	1 to 15
Biased Amplifier Offset (of TAC Range)	0 % to 100 %	0 % to 50 %		0 % to 50 %
Time Range incl. Biased Amplifier	3.3 ns to 5 µs	1.67 ns to 2.5 µs		0.834 ns to 50 ns
Min. Time Channel Width	813 fs	407 fs		203 fs
ADC Principle	50 ns Flash ADC with Error Correction
Diff. Nonlinerarity	< 0.5 % RMS, typ. < 1 % peak-peak
Data Acquisition	Histogram Mode
Method	on-board multi-dim. histogramming process
Dead Time	100 ns, independent of computer speed
Saturated Count Rate	10 MHz
Useful Count Rate	5 MHz	10 MHz
Max. Counts / Time Channel	16 bits
Overflow Control	none, stop, repeat and correct
Collection Time	0.1 µs to 100,000 s
Diplay Interval Time	0.1 µs to 100,000 s	10 ms to 100,000 s
Repeat Time	0.1 µs to 100,000 s
Sequencing Recording	Programmable Hardware Sequencer, unlimited recording by Memory swapping, in curve mode and scan mode
Syncronisation with Scanning	Pixel, Line and Frame from Scanning Device
Input Count Enable Control	1 bit, TTL
Input Experiment Trigger	TTL
Data Acquisition	FIFO / Parameter-Tag Mode
Method	Time and wavelength tagging of individual photons and continuous writing to disk
Online Display	Decay functions, FCS, Cross-FCS, PCH MCS Traces
FCS Calculation	Multi-tau algorithm, online calculation and online fit
Number of counts of decay/ waveform recording	unlimited
Dead Time	100 ns
Saturated Count Rate, Peak	10 MHz
Sustained Count Rate (bus transfer limit)	typ. 4 MHz
Output Data Format (ADC / Macrotime / Routing)	2012-12-04
FIFO Buffer Capacity (Photons)	2 * 106
Macro Timer Resolution, Internal Clock	25 ns, 12 bit, overflows marked by MOTF entry in data stream
Input Macro Timer Resolution, Clock from Sync	10 ns to 100 ns, 12 bit, overflow marked by MOTF entry in data stream
Input Curve Control (external Routing)	4 bit, TTL
External Event Markers	4 bit, TTL
Input Count Enable Control	1 bit, TTL
Input Experiment Trigger	TTL
Data Acquisition	FIFO / Parameter-Tag Imaging Mode
Method	Buildingup images from time- and wavelength tagged data
Online Display	up to 8 Images in different time and wavelength windows
Synchronisation with Scanner	via Frame Clock, Line Clock and Pixel Clock Pulses
Detector / Wavelength Channels	1 to 16
Image resolution (64-bit SPCM Software)
No. of Time Channels	64	256	1024		4096
No. of Pixels, 1 Detector Channel	4096 x 4096	2048 x 2048	1024 x 1024		512 x 512
No. of Pixels, 16 Detector Channels	1024 x 1024	512 x 512	256 x 256		128 x 128
Operation Environment
PC System	Windows 8 / 10, > 8 GB RAM, 64 bit operating system recommended
PC Interface	PCI
Power Consumption	approx. 12 W from +5 V, 0.7 W from +12 V
Dimensions	240 mm x 130 mm x 15 mm

Application

STED FLIM
Ophthalmic FLIM
In Vivo Imaging of Skin
Fluorescence Correlation – FCS
Fluorescence Cross Correlation
Full Correlation Down to Picoseconds
Antibunching Experiments
NIRS
fNIRS
DCS – Diffuse Correlation