PRODUCTS
Solutions for Spectroscopy, TCSPC & Imaging
Super Range TE Cooled Spectrometer
190-1100nm
-30 deg cooling & 80% noise reduction(TEC-X2 모델.옵션)
Catalog
Specification
Dynamic range: | 2000:1 with 6 decades |
Optical resolution: | < 1 nm Resolving Res. with 25um slit |
Detector type: | CMOS/CCD or PDA, 2k/3k pixels |
Detector range: | C=190-850nm or CXR=280-900nm |
Pixel size: | 14 x 200um (CMOS/CCD) or 7 x 200um (PDA) |
Diffraction Gratings: | Concave; Aberration corrected |
Grating g/mm: | Holographic, 590 g/mm |
Spectrograph: | f/2, Flat field – No mirrors |
Order sorting filters: | Integrated multi-band |
Signal to noise: | 1000:1 CCD, *TEC optional upgrade |
Digitizer: | 16-bit |
Dimensions: | 69 x 100 x 150mm |
Power consumption: | < 100 mA via USB port |
Interface Options: | USB2 or Wifi (2), RS232 (3), SPI3, 4-20mA (3) Digital I/O (3) or ethernet (3) |
Detector Integration: | 1ms to 8 minutes |
Data Transfer Speed: | 30Hz or 1000Hz (1) |
Slit size options: | 14, 25, 50, 100, 200um |
Stray light: | 0.02% at 435 nm; 0.2% at 200 nm |
Fiber optic input: | SMA-905 0.22na single fiber |
Operating systems: | Windows and Linux (2), Andriod (2), iOS (2) |
Software included: | SpectraWiz Program, WinSDK (C,C#,VB, Delphi), Customizable LabVIEW, VBA for Excel (CRI & LED Report) |
(1) zAP1 Electronics Upgrade (2) zAP2 Wifi + Applications Processor Upgrade with SpectraWiz Mobile Software (3) SMART-Control Interface
제품정보
Model | Wavelength Range (nm) |
Grating |
Slit-200 nm res. |
Slit-100 nm res. |
Slit-50 nm res. |
Slit-25 nm res. |
Slit-14 nm res. |
SILVER-Nova | 190-1110 | Dual Blaze @250 &1000nm | 8 | 4 | 2 | 1 | 0.75 |